Built-in test for VLSI: Pseudorandom techniques 论文

1989Integration引用 866
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisElectrostatic Discharge in Electronics
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisElectrostatic Discharge in Electronics
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Built-in test for VLSI: Pseudorandom techniques · 作者

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