The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction 论文

2003引用 316
DOI
Radiation Effects in ElectronicsSemiconductor materials and devicesVLSI and Analog Circuit Testing
VLSI and Analog Circuit TestingRadiation Effects in ElectronicsSemiconductor materials and devices
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The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction · 相关技术

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