The Cost of Application-Class Processing: Energy and Performance Analysis of a Linux-Ready 1.7-GHz 64-Bit RISC-V Core in 22-nm FDSOI Technology论文
IEEE Transactions on Very Large Scale Integration (VLSI) Systems2019引用: 390
A new golden age for computer architecture论文
Communications of the ACM2019引用: 643
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose论文
IEEE Transactions on Nuclear Science2018引用: 218
Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives论文
Proceedings of the IEEE2017引用: 298
Reviewing the Evolution of the NAND Flash Technology论文
Proceedings of the IEEE2017引用: 252
Knights Landing: Second-Generation Intel Xeon Phi Product论文
IEEE Micro2016引用: 443
Flush+Flush: A Fast and Stealthy Cache Attack论文
Lecture notes in computer science2016引用: 548
A two-qubit logic gate in silicon论文
Nature2015引用: 920
A First Step Toward Cost Functions for Quantum-Dot Cellular Automata Designs论文
IEEE Transactions on Nanotechnology2014引用: 224
Flipping bits in memory without accessing them: An experimental study of DRAM disturbance errors论文
2014引用: 405
Threshold Voltage Distribution in MLC NAND Flash Memory: Characterization, Analysis and Modeling论文
Design, Automation & Test in Europe Conference & Exhibition (DATE), 20132013引用: 225
Single Event Transients in Digital CMOS—A Review论文
IEEE Transactions on Nuclear Science2013引用: 393
Common pitfalls in nanotechnology: lessons learned from NCI's Nanotechnology Characterization Laboratory论文
Integrative Biology2012引用: 258
Energy consumption in optical modulators for interconnects论文
Optics Express2012引用: 222
Error Patterns in MLC NAND Flash Memory: Measurement, Characterization, and Analysis论文
2012引用: 321
Low Complexity Design of Ripple Carry and Brent–Kung Adders in QCA论文
IEEE Transactions on Nanotechnology2011引用: 227
Cache Hierarchy and Memory Subsystem of the AMD Opteron Processor论文
IEEE Micro2010引用: 215
Facelift: Hiding and slowing down aging in multicores论文
2008引用: 256
VARIUS: A Model of Process Variation and Resulting Timing Errors for Microarchitects论文
IEEE Transactions on Semiconductor Manufacturing2008引用: 421
Bit error rate in NAND Flash memories论文
2008引用: 358
第 1-20 条，共 48 条
上一页下一页