High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity 论文
2005Ultramicroscopy引用 672
Non-Destructive Testing TechniquesAdvanced Surface Polishing TechniquesOptical measurement and interference techniques
详细信息
- 发表期刊/会议
- Ultramicroscopy
- 发表日期
- 2005-11-16
- 发表年份
- 2005
关键词
Non-Destructive Testing TechniquesAdvanced Surface Polishing TechniquesOptical measurement and interference techniques