High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity 论文

2005Ultramicroscopy引用 672
DOI
Non-Destructive Testing TechniquesAdvanced Surface Polishing TechniquesOptical measurement and interference techniques
Optical measurement and interference techniquesNon-Destructive Testing TechniquesAdvanced Surface Polishing Techniques
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High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity · 相关事件

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