Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review 论文

1984IBM Journal of Research and Development引用 539
DOI
Radiation Effects in ElectronicsVLSI and Analog Circuit TestingSemiconductor materials and devices
VLSI and Analog Circuit TestingRadiation Effects in ElectronicsSemiconductor materials and devices
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Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review · 作者

M

M. Y. Hsiao

C

C. L. Chen