A stochastic wire-length distribution for gigascale integration (GSI). I. Derivation and validation 论文

1998IEEE Transactions on Electron Devices引用 330
DOI
VLSI and Analog Circuit TestingVLSI and FPGA Design TechniquesLow-power high-performance VLSI design
VLSI and FPGA Design TechniquesLow-power high-performance VLSI designVLSI and Analog Circuit Testing
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A stochastic wire-length distribution for gigascale integration (GSI). I. Derivation and validation · 作者

J

J.D. Meindl

V

Vivek De

J

Jeffrey A. Davis