Upset hardened memory design for submicron CMOS technology 论文

1996IEEE Transactions on Nuclear Science引用 1143
DOI
Radiation Effects in ElectronicsVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure Analysis
VLSI and Analog Circuit TestingRadiation Effects in ElectronicsIntegrated Circuits and Semiconductor Failure Analysis
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Upset hardened memory design for submicron CMOS technology · 作者

R

Raoul Velazco

M

M. Nicolaidis

T

T. Calin