Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead 论文
2014Journal of Electronic Testing引用 247
Physical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisElectrostatic Discharge in Electronics
详细信息
- 发表期刊/会议
- Journal of Electronic Testing
- 发表日期
- 2014-02-01
- 发表年份
- 2014
关键词
Physical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisElectrostatic Discharge in Electronics