Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead 论文

2014Journal of Electronic Testing引用 247
DOI
Physical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisElectrostatic Discharge in Electronics
Physical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisElectrostatic Discharge in Electronics
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Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead · 相关技术

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