Embedded deterministic test for low cost manufacturing test 论文

2003引用 401

VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis Engineering and Test Systems

Embedded deterministic test for low cost manufacturing test · 作者

Jun Qian

Geir Egil Eide

Grzegorz Mrugalski

N. Tamarapalli

Andre Hertwig

Kun-Han Tsai

Robert G. Thompson

Nilanjan Mukherjee

Mark Kassab

Jerzy Tyszer

J. Rajski