On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs 论文

2005Design, Automation, and Test in Europe引用 241
DOIArXivPDF
Radiation Effects in ElectronicsVLSI and Analog Circuit TestingLow-power high-performance VLSI design
Low-power high-performance VLSI designVLSI and Analog Circuit TestingRadiation Effects in Electronics
关系图谱

On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs · 相关文章

暂无数据