On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs 论文

2005Design, Automation, and Test in Europe引用 241
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Radiation Effects in ElectronicsVLSI and Analog Circuit TestingLow-power high-performance VLSI design
Low-power high-performance VLSI designVLSI and Analog Circuit TestingRadiation Effects in Electronics
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On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs · 作者

M

M. Sonza Reorda

L

Luigi Carro

L

Luca Sterpone

F

Fernanda Lima Kastensmidt