A Digital 1.6 pJ/bit Chip Identification Circuit Using Process Variations 论文

2008IEEE Journal of Solid-State Circuits引用 261
DOI
Physical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit Testing
VLSI and Analog Circuit TestingPhysical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure Analysis
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