Destructive single-event effects in semiconductor devices and ICs 论文

2003IEEE Transactions on Nuclear Science引用 265
DOI
Radiation Effects in ElectronicsIntegrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit Testing
VLSI and Analog Circuit TestingRadiation Effects in ElectronicsIntegrated Circuits and Semiconductor Failure Analysis
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Destructive single-event effects in semiconductor devices and ICs · 作者

F

F.W. Sexton