X-Compact: An Efficient Response Compaction Technique 论文

2004IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems引用 220
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisRadiation Effects in Electronics
VLSI and Analog Circuit TestingRadiation Effects in ElectronicsIntegrated Circuits and Semiconductor Failure Analysis
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