Error Patterns in MLC NAND Flash Memory: Measurement, Characterization, and Analysis 论文

2012引用 321

Advanced Data Storage TechnologiesCellular Automata and ApplicationsSemiconductor materials and devices

半导体 Advanced Data Storage Technologies Cellular Automata and Applications Semiconductor materials and devices

Error Patterns in MLC NAND Flash Memory: Measurement, Characterization, and Analysis · 相关文章

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