Error Patterns in MLC NAND Flash Memory: Measurement, Characterization, and Analysis 论文

2012引用 321
Advanced Data Storage TechnologiesCellular Automata and ApplicationsSemiconductor materials and devices
半导体Advanced Data Storage TechnologiesCellular Automata and ApplicationsSemiconductor materials and devices
关系图谱

Error Patterns in MLC NAND Flash Memory: Measurement, Characterization, and Analysis · 作者

Y

Yu Cai

K

Ken Mai

O

Onur Mutlu

E

Erich F. Haratsch